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HOME Test and Measurement Analyzers Communication Analyzers Keysight formerly Agilent T&M 37717C

Keysight formerly Agilent T&M 37717C

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Description of Keysight formerly Agilent T&M 37717C

Categories: Analyzers, Communication Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: 37717C

Condition: Used

Keysight (formerly Agilent T&M) 37717C Communications Analyzer

Description

Description

The Keysight HP 37717C is a used OmniBER 717 Communications Performance Analyzer. Keysight’s OmniBER 717 communications performance analyzer offers a single-box, field-portable multi-rate tester to 622Mb/s for installation, maintenance, and commissioning of hybrid PDH/SDH/SONET and ATM transport networks and network equipment. OmniBER 717 can be configured as a dual standard SONET/SDH analyzer for BER and jitter tests, which makes it the ideal tool for testing network equipment in a manufacturing environment. The dual SONET/SDH capability along with comprehensive remote control of the instruments rich feature set means that production lines can be rapidly reconfigured to test either SONET or SDH.

Product specifications of Keysight formerly Agilent T&M 37717C (From Used-Line T&M Specifications)

  • Launch Date Jan-2049
  • Status Discontinued by Manufacturer

The HP OmniBER 717C (37717C) communications performance analyzer offers a single-box, field-portable multi-rate tester for installation, maintenance, and commissioning of hybrid PDH/SDH/SONET and ATM networks. It is a modular, portable analyzer that supports optical and electrical interfaces for TCarrier, PDH, SONET, SDH, ATM, jitter, and LAN applications from 704 kb/s to 622 Mb/s.

  • Easy-to-read display
  • Dedicated slots for optical interface, printer/remote-control module
  • Additional eight slots for other interface and measurement modules
  • Full width printing of screen (screen dump)
  • View events graphically with timestamps
  • Optical power measurements (option)
  • Measurement of clock frequency and amount of frequency offset; test for network clock recovery capability
  • Trouble Scan mode for alarm and error scans
  • PDH/DSn
    • Alarm Scan mode to show the state of all alarms when scanning within a PDH/DSn network hierarchy
    • Check 64 kb/s or Nx64 kb/s digital paths (to ITU-T G.704: 1 to 31 contiguous and non-contiguous timeslots)
    • Access to and modification of spare bits
    • Generate alarms to check PDH/DSn network elements and tributary insert ports
  • SDH
    • View the section and path overhead bytes of a received SDH signal
    • Overhead sequences and overhead BER measurement
    • RSOH or MSOH DCC drop and insert
    • PDH drop and insert - Drop/insert of 34/140/2 Mb/s to or from an STM-1/STM-4 signal
    • Pointer adjustments and analysis, and pointer location graph
    • Thru mode for in-service monitoring where no protected monitor points are available
    • SDH alarm scan (in-service) and BIP scan
    • Positive and negative pointer adjustments followed by analysis
    • Mixed payloads - Generate mixed TU-3 and TU-12 signal structures to test network elements, configured to carry mixed 2 Mb/s and 34 Mb/s traffic
    • Automatic verification of VC-n paths, using the out-of-service tributary scan for faster installation testing
  • SONET
    • Overhead access and BER measurement
    • Drop and insert of TOH and TOH DCC channels
    • Pointer adjustments and analysis, and pointer location graph
    • SONET alarm scan (in-service) and BIP scan
    • DSn/PDH drop and insert
    • Thru mode for in-service monitoring where no protected monitor points are available
    • Automatic verification of VTn paths using the out-of-service tributary scan for faster installation testing
    • Mixed payloads - Generate mixed STS-1 signal structures within STS-3/OC-3 signal structures to test network elements
  • ATM
    • Change cell stream bandwidth to quickly obtain quality-of-service data for the ATM network
    • AAL monitoring
    • Graphical display of maximum, mean, and minimum cell rate on a chosen VC for short or extended periods
    • Ping tests for Ethernet LAN interfaces
    • Channel view
    • Graphical display for 1-point and 2-point cell delay variation and nonconforming cell count
  • Jitter
    • Automatic jitter tolerance test for verifying network equipment performance margins
    • Test jitter accumulation in regenerative repeaters
    • Jitter sweep and spot frequency
    • PDH and SDH output jitter measurements

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