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HOME Test and Measurement Analyzers Communication Analyzers Keysight Technologies (Agilent HP) 37717C For Sale Agilent 37717C

Agilent 37717C

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Agilent 37717C
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Flag of GermanyEquipment Location: Germany      
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Description of Agilent 37717C

Categories: Analyzers, Communication Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: 37717C

Condition: Used

Seller: Rosenkranz Elektronik

Keysight (Agilent/HP) 37717C Opts: A3D, USA, USS

The 37717C PDH/SDH/SONET Communications Performance Analyzer offers modular, upgradable one-box solutions for installation, field maintenance, commissioning and manufacturing. Rugged and portable, it allows full functional testing of SDH, PDH, and ATM equipment, including jitter generation and measurement up to 622 Mb/s. The unit has color display, graphics, printer, and dual-standard SONET/SDH capability.
Option: A3D, USA, USS

Product specifications of Agilent 37717C (From Used-Line T&M Specifications)

  • Launch Date
  • Status Discontinued by Manufacturer

The HP OmniBER 717C (37717C) communications performance analyzer offers a single-box, field-portable multi-rate tester for installation, maintenance, and commissioning of hybrid PDH/SDH/SONET and ATM networks. It is a modular, portable analyzer that supports optical and electrical interfaces for TCarrier, PDH, SONET, SDH, ATM, jitter, and LAN applications from 704 kb/s to 622 Mb/s.

  • Easy-to-read display
  • Dedicated slots for optical interface, printer/remote-control module
  • Additional eight slots for other interface and measurement modules
  • Full width printing of screen (screen dump)
  • View events graphically with timestamps
  • Optical power measurements (option)
  • Measurement of clock frequency and amount of frequency offset; test for network clock recovery capability
  • Trouble Scan mode for alarm and error scans
  • PDH/DSn
    • Alarm Scan mode to show the state of all alarms when scanning within a PDH/DSn network hierarchy
    • Check 64 kb/s or Nx64 kb/s digital paths (to ITU-T G.704: 1 to 31 contiguous and non-contiguous timeslots)
    • Access to and modification of spare bits
    • Generate alarms to check PDH/DSn network elements and tributary insert ports
  • SDH
    • View the section and path overhead bytes of a received SDH signal
    • Overhead sequences and overhead BER measurement
    • RSOH or MSOH DCC drop and insert
    • PDH drop and insert - Drop/insert of 34/140/2 Mb/s to or from an STM-1/STM-4 signal
    • Pointer adjustments and analysis, and pointer location graph
    • Thru mode for in-service monitoring where no protected monitor points are available
    • SDH alarm scan (in-service) and BIP scan
    • Positive and negative pointer adjustments followed by analysis
    • Mixed payloads - Generate mixed TU-3 and TU-12 signal structures to test network elements, configured to carry mixed 2 Mb/s and 34 Mb/s traffic
    • Automatic verification of VC-n paths, using the out-of-service tributary scan for faster installation testing
  • SONET
    • Overhead access and BER measurement
    • Drop and insert of TOH and TOH DCC channels
    • Pointer adjustments and analysis, and pointer location graph
    • SONET alarm scan (in-service) and BIP scan
    • DSn/PDH drop and insert
    • Thru mode for in-service monitoring where no protected monitor points are available
    • Automatic verification of VTn paths using the out-of-service tributary scan for faster installation testing
    • Mixed payloads - Generate mixed STS-1 signal structures within STS-3/OC-3 signal structures to test network elements
  • ATM
    • Change cell stream bandwidth to quickly obtain quality-of-service data for the ATM network
    • AAL monitoring
    • Graphical display of maximum, mean, and minimum cell rate on a chosen VC for short or extended periods
    • Ping tests for Ethernet LAN interfaces
    • Channel view
    • Graphical display for 1-point and 2-point cell delay variation and nonconforming cell count
  • Jitter
    • Automatic jitter tolerance test for verifying network equipment performance margins
    • Test jitter accumulation in regenerative repeaters
    • Jitter sweep and spot frequency
    • PDH and SDH output jitter measurements

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