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HOME Test and Measurement Analyzers Communication Analyzers HP 37717C

HP 37717C

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HP 37717C
  • ¥5250

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Flag of JapanEquipment Location: Japan      
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Description of HP 37717C

Categories: Analyzers, Communication Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: 37717C

Condition: Used

Seller: Hitech&Facility

HP 37717C

/A1T,A3B,A3K,A3V,UH1,UH4,UK6,UKX,UKZ,OYK Communication Analyzer
In stock
SDH PDH testing ATM cell&service layer test set ATM cell layer test:full error,alarm,jitter,frequency generation,pointer sequence generation.ATM service layer test:traffic simulation,monitoring SN:GB00001004
OPT-A1T:GenerationAnalysis STM1 ElectricSDH signals,SDH FrequOffset and Alarm/Error Generation and pointer Gene overhead access
OPT-A3B:Remote Control HP-IB,RS232C LAN Printer port
OPT-A3V:STM-1 optical&Electric and PDH Jitter Measure and Automatic Jitter Transfer
OPT-UH1:STM-1 opticalInterface at 1310nm
OPT-UH4:Optical Adaptor FC/PC
OPT-UK6:calibration certificate
UKX:Printer UKZ:ATM on DS1,DS3,E1,E3
OPT-0YK:BroadBand Auxiliary ATM Generation&measurment

Product specifications of HP 37717C (From Used-Line T&M Specifications)

  • Launch Date Jan-2049
  • Status Discontinued by Manufacturer

The HP OmniBER 717C (37717C) communications performance analyzer offers a single-box, field-portable multi-rate tester for installation, maintenance, and commissioning of hybrid PDH/SDH/SONET and ATM networks. It is a modular, portable analyzer that supports optical and electrical interfaces for TCarrier, PDH, SONET, SDH, ATM, jitter, and LAN applications from 704 kb/s to 622 Mb/s.

  • Easy-to-read display
  • Dedicated slots for optical interface, printer/remote-control module
  • Additional eight slots for other interface and measurement modules
  • Full width printing of screen (screen dump)
  • View events graphically with timestamps
  • Optical power measurements (option)
  • Measurement of clock frequency and amount of frequency offset; test for network clock recovery capability
  • Trouble Scan mode for alarm and error scans
  • PDH/DSn
    • Alarm Scan mode to show the state of all alarms when scanning within a PDH/DSn network hierarchy
    • Check 64 kb/s or Nx64 kb/s digital paths (to ITU-T G.704: 1 to 31 contiguous and non-contiguous timeslots)
    • Access to and modification of spare bits
    • Generate alarms to check PDH/DSn network elements and tributary insert ports
  • SDH
    • View the section and path overhead bytes of a received SDH signal
    • Overhead sequences and overhead BER measurement
    • RSOH or MSOH DCC drop and insert
    • PDH drop and insert - Drop/insert of 34/140/2 Mb/s to or from an STM-1/STM-4 signal
    • Pointer adjustments and analysis, and pointer location graph
    • Thru mode for in-service monitoring where no protected monitor points are available
    • SDH alarm scan (in-service) and BIP scan
    • Positive and negative pointer adjustments followed by analysis
    • Mixed payloads - Generate mixed TU-3 and TU-12 signal structures to test network elements, configured to carry mixed 2 Mb/s and 34 Mb/s traffic
    • Automatic verification of VC-n paths, using the out-of-service tributary scan for faster installation testing
  • SONET
    • Overhead access and BER measurement
    • Drop and insert of TOH and TOH DCC channels
    • Pointer adjustments and analysis, and pointer location graph
    • SONET alarm scan (in-service) and BIP scan
    • DSn/PDH drop and insert
    • Thru mode for in-service monitoring where no protected monitor points are available
    • Automatic verification of VTn paths using the out-of-service tributary scan for faster installation testing
    • Mixed payloads - Generate mixed STS-1 signal structures within STS-3/OC-3 signal structures to test network elements
  • ATM
    • Change cell stream bandwidth to quickly obtain quality-of-service data for the ATM network
    • AAL monitoring
    • Graphical display of maximum, mean, and minimum cell rate on a chosen VC for short or extended periods
    • Ping tests for Ethernet LAN interfaces
    • Channel view
    • Graphical display for 1-point and 2-point cell delay variation and nonconforming cell count
  • Jitter
    • Automatic jitter tolerance test for verifying network equipment performance margins
    • Test jitter accumulation in regenerative repeaters
    • Jitter sweep and spot frequency
    • PDH and SDH output jitter measurements

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