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Categories: Test Sets, S-Parameter Test Sets
Manufacturer: Keysight Technologies (Agilent HP)
Model: 35677B
Condition: Used
Seller: Testwall Ltd
Keysight (Agilent) 35677B
200MHz 75 Ohm S Parameter Test Set
Agilent/HP 35677B S-Parameter Test Set 100 kHz – 200 MHz, 75 Ohm S-Parameter Test Set Hardware required to make transmission and reflection measurements.
The HP 35677B is a 100 kHz to 200 MHz scattering parameter test set built for use with the 3577A network analyzer. Although test setups can be constructed from discrete RF components such as power dividers, directional bridges, cables, and pads, it is much easier to use a fully integrated test set such as the 35677B. The 35677B has 75 ohm test ports. This test set provides a convenient method for making reflection and transmission measurements of one- and two-port devices. The 3577A provides signal, power, and control for the test set and provides a menu that includes S-parameter softkey selections in S11, S21, S12, and S22. These are defined in terms of receiver inputs and test set direction. Changing the test set direction effectively switches the signal source and termination of the device under test as though it were removed and reconnected to the test set in the reverse direction. Different S-parameters may be selected for each of the two traces.
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Keysight Agilent 35677B
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