Cascade Microtech S300

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Cascade Microtech S300nbsp;semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) andnbsp;AttoGuard(TM) shielding reduces external noise signals.nbsp;With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from ndash;55deg;C to 200deg;C.
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