National Instruments PXIe-5172

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National Instruments PXIe-5172 High-Density Oscilloscope

The NI PXIe-5172 (Part Numbers: 784224-01, 784225-01, 784226-01) High-Density Oscilloscope uses Measurement and Automation Explorer (MAX) to configure the National Instruments hardware. MAX informs other programs about what gadgets reside in the framework and how they are arranged. MAX is consequently introduced with the instrument design libraries and NI-SCOPE driver software. The PXIe-5172 module is remotely aligned at the factory. However, the user should perform a self-alignment in any of the accompanying circumstances:

• After introducing the NI PXIe-5172 for the first time in its chassis.

• After installing, uninstalling, or moving any frame module.

• When the framework is in a domain where the encompassing temperature shifts or the temperature of the module has digressed more than ± 5 ° C from the temperature in the last auto-calibration.

• Adjust periodically for small yield drifts that happen with the aging of the item.

To empower its minimized, adaptable, and powerful design, the PXIe-5172 Oscilloscope exploits innovative advances, including low-control, high-resolution ADCs utilizing the fast serial interface JESD204B for information exchange and elite, low-cost Xilinx vitality utilization.  In numerous test frameworks, the user should control the DUT or chip under test through computerized signals. Conventional automated test frameworks can sequence through the DUT modes and make the necessary steps at each stage. Now and again, automated test equipment (ATE) frameworks incorporate intelligence to progress between the DUT settings according to the estimation esteems received.