Showing Results for Tektronix SD14

The SD14 is a dual-channel, 3 GHz probe sampler designed for high-impedance signal acquisition where a 50 Ohm acquisition system is not the optimal solution. The SD14 is ideal for high-speed device characterization such as ECL, CMOS, ACL and GaAs testing. The 100 kilohm input impedance and 0.5 pF capacitance result in very low loading of the device under test. The 7 V dynamic range and ±3.5 V offset range make the SD14 suitable for testing all digital logic families as well as most analog circuits.

The SD14 consists of two samplers, each attached at the end of a 1.0 meter cable for easy circuit probing. The modular architecture of the CSA803C/11801C enables the use of extended samplers, bringing a new level of performance to sampling scopes. In conjunction with the 11801C and SM11 multi-channel unit, it is possible to configure up to 136 channels of high-impedance, high-bandwidth acquisition with measurement accuracy approaching 140 ps.

SD14 Option 01 adds a longer probe tip, two probe-to-ECB (etched circuit board) adapters, and two probe-to-SMB adapters. These ease the probing of plated holes (as found in Outboards for IC testers) and semi-permanent connections. 

• 100 kilohm, 0.5 pF Typical
• 7 Vp-p Dynamic Range
• 3 GHz Bandwidth
• Dual channel
• Rise Time: 140 ps
• Dot Transient Response - Accuracy after calibration at operating temperature is ±5% for signals up to 0.5 Vp-p. Adjustable to unity for signals up to 1.0 Vp-p
• Displayed Noise: Maximum, typical, with unity dot response: 8 mV, 7 mV
• Aberrations (typical): <1.5 ns after step: +12%, -25%, 1.5 ns to 4 ns after step: +1%, -3%, 4 ns to 30 ns after step: ±2%. Elsewhere: ±1%
• Maximum Input Voltage: ±15 V
• Offset range: ±3.5 V
• Offset accuracy: ±(20 mV +1%)
• Time matching: Adjustable; 350 ps range