Seller: NSCA Technologies LLC
Location: USA
Seller: Liberty Test Equipment, Inc.
Seller: Test Equipment Experts
Seller: Valuetronics International Inc
A total of six current probes are available for use with the AM503B and AM5030 Current Probe Amplifiers. Since all six probes are of the split-core mechanical design, they easily clip on and off of a conductor. All the probes provide simultaneous DC and AC current measurements with a wide range of current amplitude and bandwidth capabilities.
The AM503 Current Probes convert the DC and AC flux field of a conductor to a voltage signal which is sent to an AM503B or AM5030 Amplifier. The probes include both a Hall Effect device, which senses the DC current, and a ferrite transformer which senses the AC current. The probes also utilize a bucking current from the Amplifier, which eliminates core saturation. The bucking current for the A6302XL is 20 A, 100 A for the A6303XL and 500 A for the A6304XL.
The three XL current probes add both convenience and expanded current measurement capability. The XL probes are designed to operate with the AM503B and AM5030 Current Probe Amplifiers. They are incompatible with the older AM503 and AM503A amplifiers. The XL (for extra long) probes have eight-meter cables, which allow you to reach test points on large devices such as heavy duty motors or automobiles. In addition, connecting to test points on transportation platforms such as trains, ships or aircraft is much easier with the XL probes.
The A6302XL and A6303XL are modified versions of the A6302 and A6303 probes. The A6302XL can measure 20 A continuous (50 A peak) signals from DC to 17 MHz. The A6303XL can measure 100 A continuous (500 A peak) signals from DC to 10 MHz.
The A6304XL is rated for 500 A continuous (700 A peak) and is the same size as the A6303XL. The A6304XL has a bandwidth of DC to 2 MHz and is especially well suited for measurements on high-performance inverters, motor drives and other high current switch-mode control devices. The eight meter cable makes it very easy to access test points on devices physically separated from your measurement instrument.