Showing Results for Keysight Technologies (Agilent HP) 8757C

The HP 8757C Scalar Analyzer makes swept microwave and millimeter-wave component measurements over the 10 MHz to 110 GHz frequency range with the appropriate detectors and directional bridge. The HP 8757C can measure return loss, SWR, insertion loss, power, and voltage, in either a CW or a swept trace data format. The raster display provides high resolution for viewing measurements.

Eight CRT attributes, such as the grid, the measurement traces for each channel, and the labels are shown in various factory-defined colors. The hue, saturation, and color intensity are adjustable for each of these CRT attributes. The analyzer can drive both the internal display and one external monitor simultaneously. Color or monochrome monitors can be used, provided that they are compatible with the scan rate and video levels of the analyzer.

The 8757C is locally operated by front panel controls and by menu selection using softkeys adjacent to the CRT. The analyzer is programmable over the HP-IB. On-screen graphics can be generated using a subset of HP-GL.

The 8757C uses either AC or DC detection techniques in conjunction with its detectors. In AC detection, an RF or microwave signal is amplitude modulated with a 27.778 kHz square wave, providing the stimulus to the device under test. The output signal from the DUT is then detected by a compatible detector, and the analyzer filters, digitizes, and displays the response on the CRT. A 27.778 kHz modulation signal is available from the rear panel of the analyzer to drive an external modulator for a source without internal amplitude modulation capability. In DC detection, an unmodulated CW signal provides the stimulus to the DUT. This signal is rectified by the detector and then transformed into an AC detectable signal. The transformation is accomplished by the chopping and sampling circuitry of the detector. The rectified signal is chopped at 27.778 kHz and made to resemble a square wave.

• Controls external printers, plotters, and sources through the 8757 system interface
• Instrument states and calibration data can be stored to and recalled from external disks
• Four display channels
• Three detector inputs, A, B, R (Optional 4 detector inputs)
• Dynamic range examples (depends on detector and mode): +16 to -60, -55, -50 dBm
• Display horizontal resolution: 101, 201, 401, 801, 1601 points
• Data display modes
  • dBm: Single channel power measurement; 0.1 to 20 dB/div resolution; -70 to +20 dBm range
  • dB: Relative power measurement (ratio or relative to trace memory); 0.1 to 20 dB/div resolution; -90 to +90 dB range
  • SWR: Relative measurements; channels 1 and 2 only; 401 points or fewer; 0.02 to 10 units/div resolution; 1.0 to 37.0 range
  • Aux: The rear panel BNC input ADC IN can be measured and displayed in volts; 0.025 to 5 V/div resolution; -10 to +10 V range
• Averaging: 2, 4, 8, 16, 32, 64, 128, or 256 successive traces may be averaged
• Smoothing: Provides a linear moving average of adjacent data points. The smoothing aperture defines the trace width to be averaged, and ranges from 0.1% to 20% of the trace width
• Normalization: Traces are stored and normalized with the highest resolution, independent of display scale/division or offset
• Horizontal CRT scan rate: 25.5 kHz
• Graphics resolution: 1024 x 400
• Rear panel connectors: Stop Sweep, DAC Out, ADC IN, Video Output
• HP-IB codes: SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PP0, DC1, DT0, C0, E1
• Transfer speed
  • ASCII, 401 point trace: 500 ms typical
  • ASCII, single point: 10 ms typical
  • Binary, 401 point trace: 30 ms typical
  • Binary, single point: 7 ms typical
• Interrupts
  • Front panel key pressed
  • Soft key only pressed
  • Numeric entry completed
  • Operation complete
  • Limit test failed
  • Syntax error
  • Action requested not possible
  • Instrument self-test error
  • Knob activity
• Options
  • Fourth detector input (four front panel detector inputs, A, B, C, R)
  • HP-IB disk drive
  • Rack mount with handles or without handles