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HOME Test and Measurement Analyzers Miscellaneous Analyzers Keysight Technologies (Agilent HP) E8362C For Sale Agilent E8362C

Agilent E8362C

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Description of Agilent E8362C

Categories: Analyzers, Miscellaneous Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: E8362C

Condition: Used

Seller: Avalon Test Equipment

Keysight/Agilent E8362C PNA Microwave Network Analyzer

10 MHz–20 GHz

Key Features & Specifications

  • 10 MHz to 20 GHz
  • 123 dB dynamic range and <0.006 dB trace noise
  • <26 usec/point measurement speed, 32 channels, 20,001 points
  • TRL/LRM calibration, on-wafer, in-fixture, waveguide, and antenna measurements
  • Mixer conversion loss, return loss, isolation, and absolute group delay
  • Amplifier gain compression, harmonic, IMD, and pulsed-RF

Product specifications of Agilent E8362C (From Used-Line T&M Specifications)

  • Launch Date
  • Instrument Type Vector, S-Parameter
  • Low end frequency limit 10 MHz
  • High End Frequency Limit 20 GHz
  • Output Power Range At 45 MHz to 10 GHz: -25 to +5 dBm. With option: -87 to +3 dBm
  • Input Noise Level Test port input noise floor varies with bandwidth and option: <-120 to <-57 dBm
  • Status --

General-purpose network analysis with optional software and/or hardware to customize for your application - such as multiport and pulsed-RF.   

  • Improved graphical user interface
  • 123 dB dynamic range and <0.006 dB trace noise
  • <26 usec/point measurement speed, 32 channels, 20,001 points
  • TRL/LRM calibration, on-wafer, in-fixture, waveguide, and antenna measurements
  • Mixer conversion loss, return loss, isolation, and absolute group delay
  • Amplifier gain compression, harmonic, IMD, and pulsed-RF
  • Unlimited number of display windows, which can be resized and re-arranged
  • Up to 24 active traces and 24 memory traces per window
  • Formats: Log or linear magnitude, SWR, phase, group delay, real and imaginary, Smith chart, polar
  • Ten independent markers per trace including reference marker for delta marker operation, as well as log or linear magnitude, phase, real, imaginary, SWR, delay, R + jX, and G + jB formats
  • Define test limit lines that appear on the display for go/no go testing
  • Linear, CW (single frequency), power or segment sweep
  • Options: Time-domain, configurable test set, frequency-offset, embedded LO measurements, extended power range and bias-tees, IF access, pulsed-RF measurement capability, 4-port and N-port measurements, and vector- and scalar- calibrated converter measurements 
  • Embedded documentation in five languages
  • GPIB/SICL/LAN/DCOM interfaces

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