Shimadzu MPC 3100

Shimadzu MPC-3100 Multi-Purpose Large Sample Compartment with its built-in integrating sphere enables the non- destructive transmission/reflectance measurements of very large samples or various-shaped samples - optical and electronic materials, including thin film, lens, large- sized glass, silicon wafers, optical parts, new materials, liquid crystal substrates and solar cells, etc. You can build a system that is well-suited for a particular measurement purpose by combining this MPC-3100 system with a variety of sample accessories, such as Absolute Specular Reflection Attachment (ASR).

ASR-3105, INCEDENT ANGLE 5ﾟ CAT: 206-16817

ASR-3112, INCEDENT ANGLE 12�CAT: 206-16100

ASR-3130, INCEDENT ANGLE 30�CAT: 206-15001

ASR-3145, INCEDENT ANGLE 45�CAT: 206-15002
MPC-3100 offers enormous flexibility for the evaluation and quality control of a wide variety of optical components over a measurement wavelength range of 240 to 2600 nm. For UV-3600 and UV-3101 UV-VIS-NIR Spectrophotometers - High performance measurements for the most demanding samples.
Maximum Sample Size:

Transmission:305 mm dia.X 50mm T or 204 mm dia.X
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