Hitachi U4150

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The U-4100 Spectrophotometer (large sample measurement system) is available for non- destructive transmittance/reflectance measurement of various optical and electronic materials including large-sized glass, silicon wafer and liquid crystal board. Wafer Reflectance/Transmittance Measurement System. �Top-mount transmittance/reflectance measurement unit (relative) for U-4100 (P/N 134-0107)�. This accessory permits measurement of the relative reflectance to the reference sample at an incident angle of 5� and measurement of the transmittance at an incident angle of 0�(the absolute reflectance cannot be measured with this accessory). The accessory also permits reflectance/transmittance measurement at a desired angle on a sample with the moving/rotating stage.