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Keithley 2651A

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Description of Keithley 2651A

Categories: Power Supplies, Power Sources

Manufacturer: Keithley

Model: 2651A

Condition: Used

Seller: Testwall Ltd

Keithley 2651A

High Power SourceMeter, 2000W Pulse, 200W DC, 100 fA, 40V, 20A DC/50A Pulse


The high power Keithley 2651A  SourceMeter is specifically designed to characterize and test high power electronics and it can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules, and subassemblies.The Keithley  2651A SourceMeter offers a highly flexible, four quadrant voltage and cur source/load coupled with precision voltage and cur meters. It can be used as a:

  • Semiconductor characterization instrument
  • V or I waveform generator
  • V or I pulse generator
  • Precision power supply
  • True cur source
  • Digital multimeter (DCV, DCI, ohms, and power with 5½-digit resolution)
  • Precision electronic load

    • Features and Specifications of the Keithley 2651A System SourceMeter include:

  • Source or sink:
    • 2,000W of pulsed power (±40V, ±50A)
    • 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
    • Up to 50A @ 40V with pA and uV Resolutiion
  • Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V
  • 1pA resolution enables precise measurement of very low leakage curs
  • 1µs per point (1MHz), continuous 18-bit sampling, accurately characterizes transient behavior
  • 1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device specific drive stimulus
  • Combines all in one instrument:
    • a precision power supply
    • cur source
    • DMM
    • arbitrary waveform generator
    • V or I pulse generator
    • measurement
    • electronic load
    • and trigger controller
  • Ability to be used as either a bench-top I-V characterization tool or as a building block component of multiple-channel I-V test systems
  • TSP Express software to quickly and easily perform common I-V tests without programming or installing software
  • LabVIEW® driver
  • ACS Basic Edition software for semiconductor component characterization (optional). ACS Basic now features a Trace mode for generating a suite of characteristic curves.
  • Keithley’s Test Script Processor (TSP®):
    • enables creation of custom user test scripts to further automate testing
    • supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
  • Parallel test execution and precision timing when multiple Series 2600A instruments are connected together in a system
  • LXI class C compliance
  • 14 digital I/O lines for direct interaction with probe stations, component handlers, or other automation tools
  • USB port for extra data and test program storage via USB memory device
  • Applications:
    • Power semiconductor, HBLED, and optical device characterization and testing
    • Characterization of GaN, SiC, and other compound materials and devices
    • Semiconductor junction temperature characterization
    • High speed, high precision digitization
    • Electromigration studies
    • High cur, high power device testing
  • 2,000W of pulsed power (±40V, ±50A)
  • 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
  • Up to 50A @ 40V with pA and uV Resolutiion
  • a precision power supply
  • cur source
  • DMM
  • arbitrary waveform generator
  • V or I pulse generator
  • measurement
  • electronic load
  • and trigger controller
  • enables creation of custom user test scripts to further automate testing
  • supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
  • Power semiconductor, HBLED, and optical device characterization and testing
  • Characterization of GaN, SiC, and other compound materials and devices
  • Semiconductor junction temperature characterization
  • High speed, high precision digitization
  • Electromigration studies
  • High cur, high power device testing

    •     

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