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HOME Test and Measurement Analyzers Network Vector Network Analyzers Keysight Technologies (Agilent HP) E8364C For Sale Keysight Agilent E8364C

Keysight Agilent E8364C

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Keysight Agilent E8364C

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Description of Keysight Agilent E8364C

Categories: Analyzers Network, Vector Network Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: E8364C

Condition: Used

Seller: Testwall Ltd

Keysight (Agilent) E8364C

50 GHz PNA Network Analyzer, 2.4 mm (m)


They Keysight (Agilent) E8364C is a popular analysis tool that can be applied to a variety of uses and devices. With the use of optional extras including both software and hardware add-ons, the E8364C can be transformed into a specific test device which can be used for multiport and pulsed-RF testing among other applications.

Key Specifications:

  • 104 dB of dynamic range and <0.006 dB trace noise
  • <26 usec/point measurement speed, 32 channels, 20,001 points
  • TRM/LRM calibration for the most accurate on-wafer, in-fixture, waveguide and antenna measurements
  • Mixer conversion loss, return loss, isolation, and absolute group delay
  • Amplifier gain compression, harmonic, IMD, and pulsed-RF

Are you looking to refurbished with warranty the E8364C? Then, Testwall is the place for you. We work hard to ensure that our products are taken care of by expert technicians, and are in good operational shape when we send it out to you. We also provide round-the-clock customer support. To know more, get in touch or request a quote today.

Product specifications of Keysight Agilent E8364C (From Used-Line T&M Specifications)

  • Launch Date
  • Instrument Type Vector, S-Parameter
  • Low end frequency limit 10 MHz
  • High End Frequency Limit 50 GHz
  • Output Power Range At 45 MHz to 10 GHz: -25 to +5 dBm. With option: -87 to +3 dBm
  • Input Noise Level Test port input noise floor varies with bandwidth and option: <-120 to <-57 dB
  • Status --

General-purpose network analysis with optional software and/or hardware to customize for your application - such as multiport and pulsed-RF.   

  • Improved graphical user interface
  • 104 dB dynamic range and <0.006 dB trace noise
  • <26 usec/point measurement speed, 32 channels, 20,001 points
  • TRL/LRM calibration, on-wafer, in-fixture, waveguide, and antenna measurements
  • Mixer conversion loss, return loss, isolation, and absolute group delay
  • Amplifier gain compression, harmonic, IMD, and pulsed-RF
  • Unlimited number of display windows, which can be resized and re-arranged
  • Up to 24 active traces and 24 memory traces per window
  • Formats: Log or linear magnitude, SWR, phase, group delay, real and imaginary, Smith chart, polar
  • Ten independent markers per trace including reference marker for delta marker operation, as well as log or linear magnitude, phase, real, imaginary, SWR, delay, R + jX, and G + jB formats
  • Define test limit lines that appear on the display for go/no go testing
  • Linear, CW (single frequency), power or segment sweep
  • Options: Time-domain, configurable test set, frequency-offset, embedded LO measurements, extended power range and bias-tees, IF access, pulsed-RF measurement capability, 4-port and N-port measurements, and vector- and scalar- calibrated converter measurements 
  • Embedded documentation in five languages
  • GPIB/SICL/LAN/DCOM interfaces

List price shown is for base price.

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