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HOME Test and Measurement Analyzers Network Microwave Network Analyzers Keysight Technologies (Agilent HP) E8363C For Sale Agilent E8363C

Agilent E8363C

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Description of Agilent E8363C

Categories: Analyzers Network, Microwave Network Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: E8363C

Condition: Used

Seller: Test Equipment Connection Corp.

Keysight (formerly Agilent) E8363C Keysight E8363C PNA Series Microwave Network Analyzer

Keysight E8363C PNA Series Microwave Network Analyzer, 10 MHz to 40 GHz The Keysight E8363C provides General-purpose network analysis with optional software and/or hardware to customize for your application - such as multiport, pulsed-RF, etc. Features:* 110 dB of dynamic range
Refurbished

Product specifications of Agilent E8363C (From Used-Line T&M Specifications)

  • Launch Date
  • Instrument Type Vector, S-Parameter
  • Low end frequency limit 10 MHz
  • High End Frequency Limit 40 GHz
  • Output Power Range At 45 MHz to 10 GHz: -25 to +5 dBm. With option: -87 to +3 dBm
  • Input Noise Level Test port input noise floor varies with bandwidth and option: <-120 to <-57 dB
  • Status Discontinued by Manufacturer

General-purpose network analysis with optional software and/or hardware to customize for your application - such as multiport and pulsed-RF.   

  • Improved graphical user interface
  • 110 dB dynamic range and <0.006 dB trace noise
  • <26 usec/point measurement speed, 32 channels, 20,001 points
  • TRL/LRM calibration, on-wafer, in-fixture, waveguide, and antenna measurements
  • Mixer conversion loss, return loss, isolation, and absolute group delay
  • Amplifier gain compression, harmonic, IMD, and pulsed-RF
  • Unlimited number of display windows, which can be resized and re-arranged
  • Up to 24 active traces and 24 memory traces per window
  • Formats: Log or linear magnitude, SWR, phase, group delay, real and imaginary, Smith chart, polar
  • Ten independent markers per trace including reference marker for delta marker operation, as well as log or linear magnitude, phase, real, imaginary, SWR, delay, R + jX, and G + jB formats
  • Define test limit lines that appear on the display for go/no go testing
  • Linear, CW (single frequency), power or segment sweep
  • Options: Time-domain, configurable test set, frequency-offset, embedded LO measurements, extended power range and bias-tees, IF access, pulsed-RF measurement capability, 4-port and N-port measurements, and vector- and scalar- calibrated converter measurements 
  • Embedded documentation in five languages
  • GPIB/SICL/LAN/DCOM interfaces

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