Agilent E5504A

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Phase Noise Measurement Solution, 50 kHz to 26.5 GHzThe new Agilent E5500 A-series phase noise measurement solutionshave been designed to minimize production ATE test times for oneportVCOs, DROs, crystal oscillators, and synthesizers and to maximizethe capability for Ramp;D benchtop applications. In addition, witha standard offset range capability from 0.01 Hz to 100 MHz, theE5500 B-series provides the capability, flexibility, and versatility tomeet changing and demanding needs placed upon the Ramp;D engineer.By building upon 30 years of Agilent low phase noise, RF design andmeasurement experience, the E5500 series solutions continue toprovide excellent measurement integrity, repeatability, and accuracy.The E5500 phase noise measurement solutions use the powerof a flexible software program to automate phase noise carrier measurements.The E5500 A-series solutions include the 70420A phasenoise test set, which contains phase detectors and phase-lock loopcircuitry, a high speed VXI digitizer with mainframe and high speedVXI-to-PC interface for base-band signal analysis, selected low-noisefrequency downconverters, and measurement software. When combinedwith a PC running Windows NT 4.0, this series provides fastphase noise measurements of carrier frequencies from 50 kHz to 1.6GHz, 6.0 GHz, 18 GHz, or 26.5 GHz over offset-from-carrier frequenciesof 0.01 Hz to 4 MHz.1 The E5500 B-series includes the 70420Aphase noise test set
Refurbished