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Categories: Measurement Sets, Misc. Measurement Sets
Condition: Used
Seller: TANAKA Corporation
#12342 NXT GmbH Film Thickness Measuring System ETA-TCM SCAN
Measurement principle : single channel inreflection power with spectroscopic analysis
Measurment : reflectance spectrum, thickness, trend display etc.
Wavelength range : 760～940nm
Thickness range : 0.1μｍ～
Measuring spot : ～2mm・
Light source : halogen lamp(50W）
Measuring table : X200 × Y200ｍｍ (electromotion)
PC : OS Windos10 Enterprise, PC installed
Dimension : approx. W600 × D700 × H500ｍｍ not included monitor
Power supply : AC100～240V 50／60Hz
Used-Line Dealer since : 2001
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Product Specs
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NXT GmbH ETA-TCM SCAN
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